机读格式显示(MARC)

• 000 01065cam a2200301 a 4500

• 001 0000346485

• 003 CAL

• 005 20200831130800.0

• 008 700928s1968 nyua b 000 0 eng

• 010 __ |a 68018663 //r932

• 040 __ |a DLC |c DLC |d DLC |d MiU |d DLC

• 050 00 |a TK6580 |b .C74 1968

• 090 __ |a TN95/C932

• 093 __ |a TN95 |2 3rd

• 099 __ |a CAL 022000368094

• 100 1_ |a Crispin, J. W. |q (John W.). |0 CAL n2005051293# |7 ba0yba0y

• 245 10 |a Methods of radar cross-section analysis / |c by members of the staff of the Conductron Corporation: J. J. Bowman [and others] edited by J. W. Crispin, Jr., and K. M. Siegel.

• 260 __ |a New York : |b Academic Press, |c 1968.

• 300 __ |a xiv, 426 p. : |b illus. ; |c 24 cm.

• 490 0_ |a Electrical science

• 504 __ |a Includes bibliographies.

• 650 _0 |a Radar cross sections.

• 650 _0 |a Radar.

• 700 1_ |a Bowman, J. J. |0 CAL n2005026647# |7 ba0yba0y

• 700 1_ |a Siegel, K. M. |q (Keeve Milton), |d 1923- |0 CAL n2005225541# |7 ba0yba0y

• 710 2_ |a Conductron Corporation.

• 920 __ |a 242010 |z 1

• 998 __ |a WUL