机读格式显示(MARC)

• 000 00699cam a2200205 i 4500

• 001 0000361707

• 003 CAL

• 005 20201028143200.0

• 008 790323s1979 dcua f00010 eng

• 040 __ |c WUL

• 090 __ |a TN3/S271

• 093 __ |a TN3 |2 3rd

• 099 __ |a CAL 022000382269

• 100 1_ |a Sawyer, David E

• 245 10 |a Semiconductor measurement technology : |b Laser scanning of active semiconductor devices-videotape script / |c David E. Sawyer and David W. Berning

• 260 __ |a Washington : |b Electronic Technology division institute for applied technology National Bureau of Standards, |c 1975.

• 300 __ |a 21 p. : |b ill. ; |c 26 cm.

• 700 1_ |a Sawyer, David E

• 700 1_ |a Berning, David W.

• 998 __ |a WUL