机读格式显示(MARC)

• 000 01016nam 2200253 4500

• 001 0000158403

• 003 CAL

• 005 20060925083200.0

• 008 060925s1980 paua b 10000 eng

• 040 __ |c SJT

• 090 __ |a TQ127.2-532/S989

• 093 __ |a TQ127.2-532 |2 4

• 099 __ |a CAL 022000339956

• 245 00 |a Lifetime factors in silicon : |b a symposium / |c sponsored by ASTM Committee F-1 on Electronics, American Society for Testing and Materials, San Diego, Calif., 15-16 Feb., 1979 ; R.D. Westbrook, symposium chairman.

• 260 __ |a Philadelphia, Pa. : |b The Society, |c c1980.

• 300 __ |a 250 p. : |b ill. ; |c 24 cm.

• 490 1_ |a ASTM special technical publication ; |v 712

• 500 __ |a "04-712000-46."

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Silicon |x Electric properties |x Congresses.

• 650 _0 |a Semiconductors |x Congresses.

• 700 1_ |a Westbrook, R.D.

• 710 2_ |a American Society for Testing and Materials. |b Committee F-1 on Electronics.

• 830 _0 |a ASTM special technical publication ; |v 712.