机读格式显示(MARC)

• 000 00683nam a2200205 a 4500

• 001 0000330370

• 003 CAL

• 005 20200731091700.0

• 008 110331s1970 enk 000 0 eng d

• 040 __ |c CcBjTSG

• 090 __ |a TP274/J74

• 093 __ |a TP274 |2 4

• 099 __ |a CALB0220110224992m

• 111 2_ |a Joint Conference on Automatic Test Systems |d (1970 : |c University of Birmingham)

• 245 10 |a Proceedings of the Joint Conference on Automatic Test Systems, Tuesday 14 to Friday 17 April 1790, Univ. of Birmingham.

• 260 __ |a London : |b IERE, |c 1970.

• 300 __ |a viii, 596 p. : |b ill. ; |c 28 cm.

• 710 2_ |a Institution of Electronic and Radio Engineers.

• 920 __ |a 231030 |z 2

• 998 __ |a SJT