机读格式显示(MARC)

• 000 01214nam a2200277 a 4500

• 001 0000329919

• 003 CAL

• 005 20200729162700.0

• 008 860626s1986 waua b 101 0 eng u

• 010 __ |a 86061937

• 020 __ |a 0892527250 (pbk.)

• 040 __ |c PUL

• 090 __ |a TN29-53/P963/690

• 093 __ |a TN29-53

• 099 __ |a CAL 022000212575 |a CAL 022000350587

• 245 00 |a X rays in materials analysis : |b novel applications and recent developments : 21-22 August 1986, San Diego, California / |c Thomas W. Rusch, chairman/editor ; cooperating organizations, Institute of Optics/University of Rochester ... [et al.].

• 260 __ |a Bellingham, Wash., USA : |b SPIE--the International Society for Optical Engineering, |c c1986.

• 300 __ |a vi, 156 p. : |b ill. ; |c 28 cm.

• 440 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 690

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Non-destructive testing |v Congresses.

• 650 _0 |a X-ray spectroscopy |v Congresses.

• 650 _0 |a Materials |x Testing |v Congresses.

• 700 1_ |a Rusch, Thomas William. |0 CAL n2005211608# |7 ba0yba0y

• 710 2_ |a Society of Photo-optical Instrumentation Engineers.

• 998 __ |a PUL