机读格式显示(MARC)

• 000 01008pam a22003011a 4500

• 001 0000329950

• 003 CAL

• 005 20200729170200.0

• 008 840319s1984 wb b 00100 eng

• 010 __ |a 84005394

• 020 __ |a 0387133208 (U.S.)

• 040 __ |a DLC |c DLC |d DLC

• 090 __ |a O484.5/O28

• 093 __ |a O484.5

• 099 __ |a CAL 022000286009

• 100 1_ |a Oechsner, H.

• 245 00 |a Thin-film and depth-profile analysis / |c edited by H. Oechsner ; with contributions by H.W. Etzkorn ... [et al.].

• 260 __ |a Berlin ; |a New York : |b Springer-Verlag, |c 1984.

• 300 __ |a xi, 205 p. ; |c 25 cm.

• 440 _0 |a Topics in current physics ; |v 37

• 500 __ |a Catalogong based on CIP information.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Thin films |x Surfaces.

• 650 _0 |a Surface chemistry.

• 650 _0 |a Sputtering (Physics)

• 700 1_ |a Oechsner, H. |q (Hans), |d 1934- |0 CAL n2005183431# |7 ba0yba0y

• 700 1_ |a Etzkorn, H. W. |0 CAL n2005070283# |7 ba0yba0y

• 998 __ |a PUL