机读格式显示(MARC)
- 000 01462nam a2200337 a 4500
- 008 861216s1987 dcua b 100 0 eng d
- 050 00 |a TK7871.85 |b .T654 1987
- 082 0_ |a 621.3815/2 |2 19
- 099 __ |a CAL 022000179201 |a CAL 022000884701 |a CAL 022000317329
- 111 2_ |a Topical Meeting on Lasers in Materials Diagnostics |d (1987 : |c Albuquerque, N.M.)
- 245 10 |a Topical Meeting on Lasers in Materials Diagnostics : |b summaries of papers presented at the Laser in Materials Diagnostics Topical Meeting, February 11-12, 1987, Albuquerque, New Mexico / |c sponsored by the Lasers and Electro-Optics Society of IEEE, Optical Society of America.
- 246 30 |a Lasers in material diagnostics
- 260 __ |a Washington, D.C. : |b Optical Society of America, |c c1987.
- 300 __ |a viii, 128 p. : |b ill. ; |c 29 cm.
- 490 1_ |a Technical digest series ; |v 1987, v. 7
- 500 __ |a Cover title: Lasers in material diagnostics.
- 504 __ |a Includes bibliographical references.
- 650 _0 |a Semiconductors |x Testing.
- 650 _0 |a Lasers |x Industrial applications.
- 710 2_ |a Lasers and Electro-optics Society (Institute of Electrical and Electronic Engineers)
- 830 _0 |a Technical digest series (Optical Society of America) ; |v 1987, v. 7.