机读格式显示(MARC)

• 000 00792cam a2200229 a 4500

• 001 0000331579

• 003 CAL

• 005 20200831161700.0

• 008 850529s1964 wiu 00000 eng

• 010 __ |a 64005579 //r85

• 040 __ |a DLC/ICU |c ICU

• 050 _0 |a QC482 |b .G4 1964

• 090 __ |a O434.13/G326(3)

• 093 __ |a O434.13 |2 4

• 099 __ |a CAL 022000366509

• 110 2_ |a General Electric Company. |b X-Ray Dept.

• 245 10 |a X-ray wavelengths for spectrometer : |b Bragg angles for crystals, ADP, EDT quartz 6.68, Si, NaCl, LiF, quartz 2.75, topaz, gypsum, PET, including X-ray absorption edges and all principle X-ray emission lines.

• 250 __ |a 3rd ed.

• 260 __ |a Milwaukee : |b s.n., |c 1964.

• 300 __ |a 1 v. (various pagings) ; |c 29 cm.

• 650 _0 |a X-ray spectroscopy |x Tables.

• 998 __ |a WUL