机读格式显示(MARC)

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• 001 0000328714

• 003 CAL

• 005 20200817112100.0

• 008 970416s1981 ilua b 000 0 eng

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• 041 0_ |a eng

• 090 __ |a TN153-53/S544/2

• 093 __ |a TN153-53

• 099 __ |a CAL 022000340269

• 100 0_ |a Shelburne, J. D.

• 245 00 |a Scanning electron microscopy/1981 : |b an international journal of scanning electron microscopy related techniques, and applications / |n Part 2 |c guest editors: J.D. Shelburne...[et al.]

• 260 __ |a AMF O'Hare [Chicago], IL : |b Scanning Electron Microscopy, Inc., |c c1981.

• 300 __ |a 516 p. : |b ill. ; |c 29 cm.

• 500 __ |a "An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope."

• 650 _0 |a Scanning electron microscopy |x Periodicals.

• 650 _2 |a Microscopy, Electron, Scanning |x Periodicals

• 700 1_ |a Shelburne, J. D. |0 CAL n2005223362# |7 ba0yba0y

• 710 2_ |a Scanning Electron Microscopy, Inc.

• 740 0_ |a SEM

• 998 __ |a SJT