机读格式显示(MARC)

• 000 01106cam a2200325 a 4500

• 001 0000327942

• 003 CAL

• 005 20200721161200.0

• 008 981216s1981 nyua b 00100 eng

• 010 __ |a 81000199 //r82

• 020 __ |a 0306406543

• 040 __ |c SJT

• 050 00 |a QC482.S6 |b E9

• 090 __ |a O65/T314

• 093 __ |a O657.31-53

• 099 __ |a CAL 022000327619

• 100 0_ |a Teo.B.K.

• 245 00 |a EXAFS spectroscopy, techniques and applications / |c edited by B.K. Teo and D.C. Joy.

• 260 __ |a New York : |b Plenum Press, |c c1981.

• 300 __ |a viii, 275 p. : |b ill. ; |c 26 cm.

• 500 __ |a Based on proceedings of a symposium held at the meeting of the Materials Research Society, Nov. 26-30, 1979, in Boston.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a X-ray spectroscopy.

• 650 _0 |a Absorption spectra.

• 650 _0 |a Extended x-ray absorption fine structure.

• 700 1_ |a Teo, B. K. |0 CAL n2005243505# |7 ba0yba0y

• 700 1_ |a Joy, David C., |d 1943- |0 CAL n2005120499# |7 ba0yba0y

• 710 2_ |a Materials Research Society.

• 920 __ |a 211260 |z 1

• 998 __ |a SJT