机读格式显示(MARC)

• 000 00646nam a22002175a 4500

• 001 0000331982

• 003 CAL

• 005 20200808092700.0

• 008 950710s1960 nyua b 001 0 eng

• 020 __ |c Y2.50

• 040 __ |c CNDLWCUMS/MSR

• 090 __ |a O657.31/C748/2

• 093 __ |a O657.31 |2 5

• 094 __ |a 53.8191

• 099 __ |a CALB0220110244149m

• 245 00 |a Advances in x-ray analysis ; v.2 : |b Proc. of the 7th Annual Conf. on applications of x-ray analysis held August 13-15, 1958 / |c William M. Mueller

• 260 __ |a New York : |b Plenum Press, |c 1960.

• 300 __ |a 359 p. : |b ill. |c 24cm

• 700 1_ |a Mueller, William M.

• 920 __ |a 251010 |z 2

• 998 __ |a SCU