机读格式显示(MARC)

• 000 00675nam a2200193 a 4500

• 001 0000333298

• 003 CAL

• 005 20200810132800.0

• 008 971217s1985 pau b 001 0 eng d

• 040 __ |c PUL

• 090 __ |a TM153-53/S283/3:3

• 093 __ |a TM153-53 |2 3

• 099 __ |a CALB0220110327317m

• 245 10 |a Scanning electron microscopy/1985/lll:an international journal of scanning electron microscopy,related techniques,and applications;pt.3 / |c guest editor R. P. Backer

• 260 __ |a New Orleans,La. : |b Scanning Electron Microscopy,Inc., |c 1985

• 300 __ |a 905-1304 p. : |b ill. ;. |c 29cm

• 504 __ |a Includes bibliographical references and index.

• 920 __ |a 580400 |z 2

• 998 __ |a ZMC