机读格式显示(MARC)

• 000 00988cam a2200265 a 4500

• 001 0000361663

• 003 CAL

• 005 20201028133000.0

• 008 950519s1986 wb a b 10110 eng

• 010 __ |a 86003921

• 020 __ |a 3540162631

• 020 __ |a 0387162631

• 040 __ |c NKL

• 090 __ |a TG1/I61

• 093 __ |a TG1 |2 5

• 099 __ |a CAL 021999620673

• 111 2_ |a International Conference on Secondary Ion Mass Spectrometry |n (5th : |d 1985 : |c Washington, D.C.)

• 245 10 |a Secondary ion mass spectrometry : |b SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 / |c editors, A. Benninghoven ... [et al.].

• 260 __ |a Berlin : |b Springer-Verlag, |c c1986.

• 300 __ |a xxi, 561 p. : |b ill. ; |c 24 cm.

• 440 _0 |a Springer series in chemical physics ; |v 44

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Secondary ion mass spectrometry |x Congresses.

• 700 1_ |a Benninghoven, A. |0 CAL n2005018002# |7 ba0yba0y

• 998 __ |a NKL