机读格式显示(MARC)

• 000 01107cam a2200301 a 4500

• 001 0000329317

• 003 CAL

• 005 20200825173800.0

• 008 981214s1983 waua b 10100 eng

• 020 __ |a 0892524642 (pbk.)

• 040 __ |c SJT

• 050 00 |a QC375 |b .P74 1983

• 090 __ |a TH744.3-53/W974

• 093 __ |a TH744.3-53

• 099 __ |a CAL 022000308143

• 100 0_ |a Wyant,James C.

• 245 00 |a Precision surface metrology : |b August 23-24, 1983, San Diego, California / |c James C. Wyant, chairman/editor.

• 260 __ |a Bellingham, Wash., USA : |b SPIE--the International Society for Optical Engineering, |c c1983.

• 300 __ |a vi, 206 p. : |b ill. ; |c 28 cm.

• 440 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 429

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Glass |x Surfaces |x Measurement |x Congresses.

• 650 _0 |a Interferometer |x Congresses.

• 650 _0 |a Optical measurements |x Congresses.

• 700 1_ |a Wyant, James C. |0 CAL n2005269820# |7 ba0yba0y

• 710 2_ |a Society of Photo-optical Instrumentation Engineers.

• 920 __ |a 211060 |z 1

• 998 __ |a SJT