机读格式显示(MARC)

• 000 01063cam a2200337 a 4500

• 001 0000152614

• 003 CAL

• 005 20200831111800.0

• 008 060831s1984 flua b 00100 eng

• 020 __ |a 0849357845 (v. 1)

• 020 __ |a 0849357853 (v. 2)

• 040 __ |c SJT

• 090 __ |a 81.103/P273/2

• 090 __ |a TB44/B399/1

• 090 __ |a TB44/B399/2

• 090 __ |a 81.103/P273/1

• 093 __ |a TB44 |2 5

• 099 __ |a CAL 022000304888

• 100 1_ |a Beddow, John K.

• 245 00 |a Particle characterization in technology / |c editor, John Keith Beddow.

• 260 __ |a Boca Raton, Fla. : |b CRC Press, |c c1984.

• 300 __ |a 2 v. : |b ill. (some col.) ; |c 27 cm.

• 440 _0 |a CRC series on fine particle science and technology

• 440 _0 |a Uniscience series on fine particle science and technology

• 504 __ |a Includes bibliographies and indexes.

• 505 0_ |a v. 1. Applications and microanalysis -- v. 2. Morphological analysis.

• 650 _0 |a Particles.

• 650 _0 |a Bulk solids.

• 650 _0 |a Particle size determination.

• 700 1_ |a Beddow, John K.

• 998 __ |a SJT