机读格式显示(MARC)

• 000 01055cam a2200253 a 4500

• 001 0000361559

• 003 CAL

• 005 20201028094700.0

• 008 760831s1976 enka b 101 0 eng

• 010 __ |a 76372965

• 040 __ |a DLC |c DLC |d DLC |d ICU |d SCT

• 090 __ |a TN14-53/I61-2

• 093 __ |a TN14-53 |2 3

• 099 __ |a CAL 022000324694 |a CAL 021999644922

• 110 2_ |a International Topical Conference on Electron Beam Research and Technology

• 245 10 |a Proceedings of the International Topical Conference on Electron Beam Research and Technology : |b Non. 3-5, 1975, Albuquerque, N. M, |n Vol. 1 of 2 / |c Co- sponsored by Sandia Laboratories at the United States Energy Research and Development Administration, Ed. by Gerold Yonas

• 246 30 |a Applications of ion beams to materials

• 260 __ |a [n. p] |c c1976.

• 300 __ |a 683 p. : |b ill. ; |c 27 cm.

• 650 _0 |a Ion implantation |v Congresses.

• 650 _0 |a Semiconductors |x Effect of radiation on |v Congresses.

• 650 _0 |a Solids |x Effect of radiation on |v Congresses.

• 700 1_ |a Yonas, Gerold

• 998 __ |a SJT