机读格式显示(MARC)

• 000 01054nam a2200265 a 4500

• 001 0000335094

• 003 CAL

• 005 20200819110400.0

• 008 751014s1961 paua b 100 0 eng

• 010 __ |a 61016815 //r

• 040 __ |a DLC |c FQG |d OCL |d m.c. |d m/c |d CLU

• 050 00 |a TK7835 |b .A47

• 090 __ |a TN01-532/A512

• 093 __ |a TN01-532 |2 4

• 094 __ |a 73.6083/A512

• 099 __ |a CAL 022003117638

• 110 2_ |a American Society for Testing and Materials. |b Committee F-1 on Materials for Electron Tubes and Semiconductor Devices.

• 245 10 |a Materials and electron device processing : |b a symposium presented at a national technical meeting of the American Society for Testing and Materials, Philadelphia. Pa., April 5-7, 1961.

• 260 __ |a Philadelphia : |b American Society for Testing and Materials, |c 1961.

• 300 __ |a viii, 283 p. : |b illus. ; |c 24 cm.

• 440 _0 |a ASTM special technical publication ; |v no. 300

• 504 __ |a Includes bibliographical references.

• 650 _0 |a Electronics |x Materials |x Congresses.

• 920 __ |a 215010 |z 1

• 998 __ |a NMU