机读格式显示(MARC)

• 000 00692cam a2200169 a 4500

• 001 0000346898

• 005 20200903141900.0

• 008 200901s1987 ctuaf b 00110 engsu

• 020 __ |a 0819408425

• 040 __ |a OWpIT |c OWp

• 090 __ |a (E)/TN2/52

• 093 __ |a TN2 |2 5

• 245 10 |a Optically based methods for process analysis : |b 23-26 March 1992, Somerset / |c David S. Bomse, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering. |k monograph

• 260 __ |a Bellingham, Wash., USA : |b SPIE, |c c1992.

• 300 __ |a 190-384 p. : |b ill. ; |c 28 cm.

• 700 1_ |a Bomse, David S.

• 830 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v.1681.