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• 000 01195pam a2200301 i 4500

• 001 0000333194

• 003 CAL

• 005 20200810102200.0

• 008 981216s1979 nyua b 00100 eng

• 010 __ |a 79017009

• 020 __ |a 0306402807

• 040 __ |c SJT

• 050 00 |a TA417.23 |b .I57

• 090 __ |a TN153-53/M626

• 093 __ |a TN153-53

• 099 __ |a CAL 022000330649

• 110 0_ |a Microbeam Analysis Society.

• 245 00 |a Introduction to analytical electron microscopy / |c edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.

• 260 __ |a New York : |b Plenum Press, |c c1979.

• 300 __ |a xv, 601 p. : |b ill. ; |c 27 cm.

• 500 __ |a "Proceedings of a workshop on analytical electron microscopy, held in San Antonio, Texas, August 13-14, 1979, as part of the joint meeting of the Electron Microscopy Society of America and the Microbeam Analysis Society."

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Electron microscopy.

• 700 1_ |a Hren, John J. |0 CAL n2005111069# |7 ba0yba0y

• 700 1_ |a Goldstein, Joseph, |d 1939- |0 CAL n2005088159# |7 ba0yba0y

• 700 1_ |a Joy, David C., |d 1943- |0 CAL n2005120499# |7 ba0yba0y

• 710 2_ |a Microbeam Analysis Society.

• 998 __ |a SJT